Applied Superconductivity Center Techniques
Microscopy Manuals and Tips:
Notes on TEM Lamellae using a Ga Focused Ion Beam (Charlie Sanabria):
Tips for making TEM lamellae using our Zeiss 1540 EsB CrossBeam Instrument.
Instructional videos:
Introduction metallographic sample preparation (Charlie Sanabria):
Using SiC pads effectively (Charlie Sanabria):
Scripts:
ImageJ macros developed at ASC for the quantitative analysis of superconducting composites.
A variety of macros that can be used in conjunction with imageJ to provide quantitative analysis of micro- and macro-structural features in superconductors.
This work is licensed under a Creative Commons Attribution 4.0 International License.
Software is licensed under MIT license.
The National High Magnetic Field Laboratory is supported by the National Science Foundation Division of Materials Research and the State of Florida. The Applied Superconductivity Center receives additional funding from the US Department of Energy, CERN and NIH.
Peter J. Lee/MagLab/ASC