Lee PJ, Larbalestier DC (2000) Position normalization as a tool to extract compositional and microstructural profiles from backscatter And Secondary Electron Images. Microscopy and Microanalysis, 6, Supplement 2:1026–1027. https://pdfs.semanticscholar.org/593b/2660a2db1726802ee83bc7e0e576779a9d47.pdf